首页> 外国专利> WRITING AND VERIFYING CIRCUIT AND METHOD FOR WRITING AND VERIFYING RESISTIVE MEMORY THEREOF

WRITING AND VERIFYING CIRCUIT AND METHOD FOR WRITING AND VERIFYING RESISTIVE MEMORY THEREOF

机译:写入和验证电路以及用于其的写入和验证电阻存储器的方法

摘要

A writing and verifying circuit and a method for writing and verifying a resistive memory thereof are provided. The steps of the method includes: enabling one word line signal corresponding to one selected resistive memory cell of the resistive memory during a writing and verifying timing period; providing a bit line voltage to the selected resistive memory cells, wherein the bit line voltage continuously increases or decreases from a first voltage level to a second voltage level during the writing and verifying timing period; and, measuring a detected current through the bit line and determining a finish time point of the writing and verifying timing period according to the detected current and a reference current.
机译:提供了一种写入和验证电路及其用于写入和验证其电阻存储器的方法。该方法的步骤包括:在写入和验证时序周期期间,使对应于电阻存储器的一个选择的电阻存储器单元的一个字线信号;以及向所选择的电阻存储单元提供位线电压,其中在写入和验证时序周期期间,位线电压从第一电压电平连续地增加或减少到第二电压电平;测量通过位线的检测到的电流,并根据检测到的电流和参考电流确定写入和验证时序周期的结束时间点。

著录项

  • 公开/公告号EP3059736B1

    专利类型

  • 公开/公告日2020-08-26

    原文格式PDF

  • 申请/专利权人 WINBOND ELECTRONICS CORP.;

    申请/专利号EP20150201793

  • 发明设计人 HUANG KOYING;

    申请日2015-12-21

  • 分类号G11C13;

  • 国家 EP

  • 入库时间 2022-08-21 11:42:59

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