首页> 外国专利> METHOD FOR MANUFACTURING A CIRCULAR WAFER BY POLISHING THE PERIPHERY, INCLUDING A NOTCH OR ORIENTATION FLAT, OF A WAFER COMPRISING CRYSTAL MATERIAL, BY USE OF POLISHING TAPE

METHOD FOR MANUFACTURING A CIRCULAR WAFER BY POLISHING THE PERIPHERY, INCLUDING A NOTCH OR ORIENTATION FLAT, OF A WAFER COMPRISING CRYSTAL MATERIAL, BY USE OF POLISHING TAPE

机译:通过使用抛光带对包括晶体材料的晶片的周边(包括刻痕或取向平整)进行抛光来制造圆形晶片的方法

摘要

Provided is a method for producing a circular wafer using a grinding tape to grind the edge of a wafer comprising a crystalline material. A primary grinding step is provided for contacting a grinding body to the peripheral portion of a wafer placed centered on a horizontal stage and rotating the stage, thus grinding the peripheral portion. The radius of the wafer is measured, and a radius is set that is no greater than the measured smallest radius, and the difference Δr between the set radius and the measured wafer radius along the peripheral portion is determined. The portions of the peripheral portion at which Δr is greater than a predetermined value are determined and a secondary grinding step is provided for contacting the peripheral portion and the grinding body, rotating the stage forwards and backwards in a predetermined range of rotational angles, and grinding the peripheral portion.
机译:提供了一种使用研磨带来研磨包含晶体材料的晶片的边缘的圆形晶片的制造方法。提供初级研磨步骤,以使研磨体与以水平平台为中心放置的晶片的外围部分接触并使该平台旋转,从而研磨外围部分。测量晶片的半径,并且将半径设置为不大于所测量的最小半径,并且确定沿周边部分的设定半径与所测量的晶片半径之间的差Δr。确定周边部分的Δr大于预定值的部分,并设置第二研磨步骤,以使周边部分和研磨体接触,使工作台在预定的旋转角度范围内向前和向后旋转,并进行研磨外围部分。

著录项

  • 公开/公告号US2016005593A1

    专利类型

  • 公开/公告日2016-01-07

    原文格式PDF

  • 申请/专利权人 MIPOX CORPORATION;

    申请/专利号US201514794984

  • 发明设计人 NAOHIRO YAMAGUCHI;

    申请日2015-07-09

  • 分类号H01L21/02;H01L21/306;H01L21/66;

  • 国家 US

  • 入库时间 2022-08-21 14:31:20

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号