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MEMS device and corresponding micromechanical structure with integrated compensation of thermo-mechanical stress

机译:具有热机械应力的综合补偿的MEMS装置和相应的微机械结构

摘要

A micromechanical structure of a MEMS device, integrated in a die of semiconductor material provided with a substrate and having at least a first axis of symmetry lying in a horizontal plane, has a stator structure, which is fixed with respect to the substrate, and a rotor structure, having a suspended mass, mobile with respect to the substrate and to the stator structure as a result of an external action, the stator structure having fixed sensing electrodes capacitively coupled to the rotor structure; a compensation structure is integrated in the die for compensation of thermo-mechanical strains. The compensation structure has stator compensation electrodes, which are fixed with respect to the substrate, are capacitively coupled to the rotor structure, and are arranged symmetrically to the fixed sensing electrodes with respect to the first axis of symmetry.
机译:MEMS器件的微机械结构,其集成在具有衬底的半导体材料的管芯中,并且具有至少第一对称轴位于水平面中,该定子结构相对于衬底固定,并且定子结构相对于衬底固定。具有悬浮质量的转子结构,由于外部作用而相对于基板和定子结构可移动,该定子结构具有固定地感测电极,该感测电极电容性地耦合至转子结构;补偿结构集成在模具中,用于补偿热机械应变。补偿结构具有相对于基板固定的定子补偿电极,该定子补偿电极电容地耦合至转子结构,并且相对于第一对称轴相对于固定的感测电极对称地布置。

著录项

  • 公开/公告号US9327962B2

    专利类型

  • 公开/公告日2016-05-03

    原文格式PDF

  • 申请/专利权人 STMICROELECTRONICS S.R.L.;

    申请/专利号US201414189774

  • 发明设计人 ANGELO ANTONIO MERASSI;

    申请日2014-02-25

  • 分类号H01L29/84;B81B3/00;G01P1/00;G01P15/125;G01P15/18;G01P15/08;

  • 国家 US

  • 入库时间 2022-08-21 14:29:45

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