首页> 外国专利> Methods of fabricating bipolar junction transistors with reduced epitaxial base facets effect for low parasitic collector-base capacitance

Methods of fabricating bipolar junction transistors with reduced epitaxial base facets effect for low parasitic collector-base capacitance

机译:具有低外延基面效应的低寄生集电极-基极电容的双极结型晶体管的制造方法

摘要

Fabrication methods, device structures, and design structures for a bipolar junction transistor. A dielectric structure is formed that is coextensive with a single crystal semiconductor material of a substrate in an active device region. A semiconductor layer is formed that includes a single crystal section coupled with the active device region. The semiconductor layer has an edge that overlaps with a top surface of the dielectric structure. An intrinsic base layer is formed on the semiconductor layer.
机译:双极结型晶体管的制造方法,器件结构和设计结构。形成在有源器件区域中与衬底的单晶半导体材料共同延伸的介电结构。形成包括与有源器件区域耦合的单晶部分的半导体层。半导体层具有与介电结构的顶表面重叠的边缘。本征基层形成在半导体层上。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号