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DISSOLUTION INHIBITOR FOR CHEMICALLY AMPLIFIED THICK FILM PHOTORESIST, PHOTORESIST COMPOSITION CONTAINING SAME, AND METHOD FOR PATTERNING ELEMENT BY USING SAME
DISSOLUTION INHIBITOR FOR CHEMICALLY AMPLIFIED THICK FILM PHOTORESIST, PHOTORESIST COMPOSITION CONTAINING SAME, AND METHOD FOR PATTERNING ELEMENT BY USING SAME
The present invention relates to a dissolution inhibitor for a chemically amplified thick film photoresist composition, a photoresist composition containing the same, and a method for patterning a semiconductor element by using the same. The dissolution inhibitor, according to the present invention, makes a large difference in solubility between an exposure part and a non-exposure part of a photoresist composition, particularly, in a photolithography process using an ultraviolet ray of an i-line as an exposure light source, and does not influence the transmittance of an irradiated light source such that a certain amount of light is reached in a vertical direction of a photoresist, and can improve line edge roughness or linearity of a pattern.
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