首页> 外国专利> DISSOLUTION INHIBITOR FOR CHEMICALLY AMPLIFIED THICK FILM PHOTORESIST, PHOTORESIST COMPOSITION CONTAINING SAME, AND METHOD FOR PATTERNING ELEMENT BY USING SAME

DISSOLUTION INHIBITOR FOR CHEMICALLY AMPLIFIED THICK FILM PHOTORESIST, PHOTORESIST COMPOSITION CONTAINING SAME, AND METHOD FOR PATTERNING ELEMENT BY USING SAME

机译:化学增强的厚膜光致抗蚀剂的溶解抑制剂,包含相同光致抗蚀剂的光致抗蚀剂组合物,以及使用相同的方法来修饰元素的方法

摘要

The present invention relates to a dissolution inhibitor for a chemically amplified thick film photoresist composition, a photoresist composition containing the same, and a method for patterning a semiconductor element by using the same. The dissolution inhibitor, according to the present invention, makes a large difference in solubility between an exposure part and a non-exposure part of a photoresist composition, particularly, in a photolithography process using an ultraviolet ray of an i-line as an exposure light source, and does not influence the transmittance of an irradiated light source such that a certain amount of light is reached in a vertical direction of a photoresist, and can improve line edge roughness or linearity of a pattern.
机译:本发明涉及用于化学放大厚膜光刻胶组合物的溶解抑制剂,包含其的光刻胶组合物以及通过使用其来对半导体元件进行构图的方法。根据本发明,溶解抑制剂使光致抗蚀剂组合物的曝光部分和非曝光部分之间的溶解度差异很大,特别是在使用i-线的紫外线作为曝光光的光刻工艺中。光源,并且不影响照射的光源的透射率,使得在光致抗蚀剂的垂直方向上到达一定量的光,并且可以改善图案的线边缘粗糙度或线性。

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