首页> 外国专利> 2 A method to trace cathodic second-phase particles at Mg alloy surface and A method to manufacture using the method to trace

2 A method to trace cathodic second-phase particles at Mg alloy surface and A method to manufacture using the method to trace

机译:2在Mg合金表面上追踪阴极第二相颗粒的方法以及使用该方法进行追踪的制造方法

摘要

A two-phase particle detection method of a magnesium alloy surface according to the present invention includes a first step of preparing a magnesium alloy sample, a second step of immersing the magnesium alloy sample in a vessel containing the alkaline aqueous solution for a predetermined time, And a third step of confirming the presence or absence of two-phase particles from the surface of the magnesium alloy sample. In the third step, whether or not the two-phase particle is present is determined from the surface of the magnesium alloy sample, . The present invention also relates to a method for detecting two-phase particles present on the surface of a magnesium alloy sample using a two-phase particle detection method on the surface of a magnesium alloy, and then removing the two-phase particles detected through brushing, And the surface of the magnesium alloy is processed.
机译:根据本发明的镁合金表面的两相颗粒检测方法包括第一步,制备镁合金样品,第二步,将镁合金样品浸入装有碱性水溶液的容器中预定的时间,第三步是确定镁合金样品表面是否存在两相颗粒。在第三步骤中,从镁合金样品的表面确定是否存在两相颗粒。本发明还涉及一种使用镁合金表面上的两相颗粒检测方法检测镁合金样品表面上存在的两相颗粒,然后去除通过刷涂检测到的两相颗粒的方法。 ,然后对镁合金的表面进行处理。

著录项

  • 公开/公告号KR101581459B1

    专利类型

  • 公开/公告日2016-01-11

    原文格式PDF

  • 申请/专利权人 한국기계연구원;

    申请/专利号KR20130161682

  • 发明设计人 문성모;장도연;김만;이상열;

    申请日2013-12-23

  • 分类号G01N33/20;B24B7;C23F15;G01N15/10;

  • 国家 KR

  • 入库时间 2022-08-21 14:13:09

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