首页> 外国专利> A METHOD TO TRACE CATHODIC SECOND-PHASE PARTICLES AT MG ALLOY SURFACE AND A METHOD TO MANUFACTURE USING THE METHOD TO TRACE

A METHOD TO TRACE CATHODIC SECOND-PHASE PARTICLES AT MG ALLOY SURFACE AND A METHOD TO MANUFACTURE USING THE METHOD TO TRACE

机译:镁合金表面阴极二相颗粒的跟踪方法及使用该方法的制造方法

摘要

According to the present invention, a method for detecting a second-phase particle on a surface of a magnesium alloy comprises: a first step for preparing a magnesium alloy sample; a second step for depositing the magnesium alloy sample for a certain period of time in a container stored with an alkaline solution; and a third step for confirming presence of a second-phase particle from the surface of the magnesium alloy sample deposited in the alkaline solution, and confirming presence of the second-phase particle in the third step with a bubble generated from the surface of the magnesium alloy sample. In addition, the present invention is configured to process a surface of a magnesium alloy as removing the second-phase particle detected through brushing, etching or polishing methods, after detecting the second-phase particle present on the surface of the magnesium alloy sample using a method of detecting a second-phase particle on a surface of a magnesium alloy.
机译:根据本发明,一种用于检测镁合金表面上的第二相颗粒的方法包括:制备镁合金样品的第一步;第二步是将镁合金样品在一定时间内存放在装有碱性溶液的容器中。第三步骤,用于从沉积在碱性溶液中的镁合金样品的表面中确认第二相颗粒的存在,并在第三步骤中利用从镁表面产生的气泡来确认第二相颗粒的存在。合金样品。另外,本发明被配置为在通过以下方法去除存在于镁合金样品表面上的第二相颗粒之后,通过去除通过刷涂,蚀刻或抛光方法检测到的第二相颗粒来处理镁合金的表面。检测镁合金表面上的第二相颗粒的方法。

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