DEVICE BY COLD JUNCTION, PROCESS FOR MANUFACTURING DEVICE, AND COLD JUNCTION APPARATUS

摘要

An inter-substrate material layer is formed between a first substrate and a second substrate to generate a bonding strength. A plurality of metal elements are present in the inter-substrate material layer. An interface element existence ratio of the plurality of metal elements is 0.07 or above. A device can be obtained in which substrates difficult to bond (for example, SiO 2 substrates) are bonded at room-temperature to have practical bonding strength.