首页> 外国专利> COMPLEMENTARY METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR, METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF

COMPLEMENTARY METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR, METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF

机译:互补金属氧化物半导体场效应晶体管,金属氧化物半导体场效应晶体管及其制造方法

摘要

A complementary metal oxide semiconductor field-effect transistor (MOSFET) includes a substrate, a first MOSFET and a second MOSFET. The first MOSFET is disposed on the substrate within a first transistor region and the second MOSFET is disposed on the substrate within a second transistor region. The first MOSFET includes a first fin structure, two first lightly-doped regions, two first doped regions and a first gate structure. The first fin structure includes a first body portion and two first epitaxial portions, wherein each of the first epitaxial portions is disposed on each side of the first body portion. A first vertical interface is between the first body portion and each of the first epitaxial portions so that the first-lightly doped region is able to be uniformly distributed on an entire surface of each first vertical interface.
机译:互补金属氧化物半导体场效应晶体管(MOSFET)包括衬底,第一MOSFET和第二MOSFET。第一MOSFET布置在第一晶体管区域内的基板上,并且第二MOSFET布置在第二晶体管区域内的基板上。第一MOSFET包括第一鳍结构,两个第一轻掺杂区,两个第一掺杂区和第一栅极结构。第一鳍片结构包括第一主体部分和两个第一外延部分,其中每个第一外延部分设置在第一主体部分的每一侧上。第一垂直界面位于第一主体部分和每个第一外延部分之间,使得第一轻掺杂区能够均匀地分布在每个第一垂直界面的整个表面上。

著录项

  • 公开/公告号US2017047426A1

    专利类型

  • 公开/公告日2017-02-16

    原文格式PDF

  • 申请/专利权人 UNITED MICROELECTRONICS CORP.;

    申请/专利号US201615335418

  • 发明设计人 SHIH-HUNG TSAI;CHIEN-TING LIN;

    申请日2016-10-26

  • 分类号H01L29/66;H01L29/78;H01L21/8238;H01L29/06;H01L27/092;H01L21/762;H01L29/08;

  • 国家 US

  • 入库时间 2022-08-21 13:50:54

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