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Superjunction device and semiconductor structure comprising the same

机译:超结器件和包括该超结器件的半导体结构

摘要

The present disclosure relates to a superjunction device and a semiconductor structure having the same. The superjunction device includes a body region of a second conduction type, a drain region of a first conduction type, a drift region located between said body region and said drain region. The drift region includes first regions of a first conduction type and second regions of a second conduction type arranged alternately along a direction being perpendicular to the direction from the body region to the drain region, and a plurality of trench gate structures, each of them comprising a trench extending into said drift region from an upper surface of said body region and a gate electrode in said trench surrounded by a first dielectric layer filling said trench, and a source region of a first conduction type embedded into said body region. There is no source region along at least 10% of the total interface length between the first dielectric layer and the body region.
机译:本公开涉及一种超结器件和具有该超结器件的半导体结构。该超结器件包括第二导电类型的主体区域,第一导电类型的漏极区域,位于所述主体区域和所述漏极区域之间的漂移区域。漂移区包括第一导电类型的第一区域和第二导电类型的第二区域,所述第一区域和第二导电类型的第二区域沿着垂直于从主体区域到漏极区域的方向的方向交替布置,以及多个沟槽栅结构,每个沟槽栅结构包括从所述主体区域的上表面延伸到所述漂移区域中的沟槽和由填充所述沟槽的第一介电层围绕的所述沟槽中的栅电极,以及嵌入所述主体区域中的第一导电类型的源极区域。在第一介电层和主体区域之间沿着总界面长度的至少10%没有源区域。

著录项

  • 公开/公告号US9653596B2

    专利类型

  • 公开/公告日2017-05-16

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AUSTRIA AG;

    申请/专利号US201615097932

  • 发明设计人 FRANZ HIRLER;ANTON MAUDER;

    申请日2016-04-13

  • 分类号H01L29/78;H01L29/06;H01L29/10;H01L29/40;H01L29/423;H01L29/08;

  • 国家 US

  • 入库时间 2022-08-21 13:45:42

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