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Reinforced wafer level package comprising a core layer for reducing stress in a solder joint and improving solder joint reliability

机译:增强的晶圆级封装,包括用于减少焊点应力和提高焊点可靠性的芯层

摘要

Some features pertain to a package that includes a redistribution portion, a first die coupled to the redistribution portion, a core layer coupled to the redistribution portion, and an encapsulation layer encapsulating the first die and the core layer. The redistribution portion includes a first dielectric layer. The core layer has a higher Young's Modulus than the encapsulation layer. In some implementations, the core layer includes a glass fiber (e.g., core layer is a glass reinforced dielectric layer). In some implementations, the core layer has a Young's Modulus of about at least 15 gigapascals (Gpa). In some implementations, the first die includes a front side and a back side, where the front side of the first die is coupled to the redistribution portion. In some implementations, the first dielectric layer is a photo imageable dielectric (PID) layer.
机译:一些特征涉及一种封装,其包括再分配部分,耦合到再分配部分的第一管芯,耦合到再分配部分的核心层以及封装第一管芯和核心层的封装层。重新分配部分包括第一介电层。核心层具有比封装层更高的杨氏模量。在一些实施方式中,芯层包括玻璃纤维(例如,芯层是玻璃增强的介电层)。在一些实施方案中,核心层具有约至少15吉帕斯卡(Gpa)的杨氏模量。在一些实施方式中,第一管芯包括正面和背面,其中第一管芯的正面耦接到再分配部分。在一些实施方式中,第一电介质层是光可成像电介质(PID)层。

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