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Semiconductor device and method for producing same having multilayer wiring structure with contact hole having hydrophobic film formed on side surface of the contact hole

机译:具有多层布线结构的半导体器件及其制造方法,该半导体器件及其多层布线结构具有在接触孔的侧面上形成有疏水膜的接触孔

摘要

A method of producing a semiconductor device includes forming an insulating film on a substrate on which a semiconductor layer is formed; removing a part of the insulating film by etching to form an opening in the insulating film; supplying steam with a temperature greater than or equal to 200° C. and less than or equal to 600° C. to the opening formed in the insulating film; after supplying the steam, applying a solution including a silicon compound to a side surface or the insulating film defining the opening; and forming a hydrophobic film on the side surface of the insulating film defining the opening by polymerizing the silicon compound.
机译:一种半导体装置的制造方法,其特征在于,在形成有半导体层的基板上形成绝缘膜。通过蚀刻去除绝缘膜的一部分以在绝缘膜中形成开口;向形成在绝缘膜上的开口供给温度为200℃以上600℃以下的蒸汽。在供应蒸汽之后,将包括硅化合物的溶液施加到限定开口的侧面或绝缘膜上;通过使硅化合物聚合而在限定开口的绝缘膜的侧面上形成疏水膜。

著录项

  • 公开/公告号US9660065B2

    专利类型

  • 公开/公告日2017-05-23

    原文格式PDF

  • 申请/专利权人 FUJITSU LIMITED;

    申请/专利号US201414513607

  • 发明设计人 SHIROU OZAKI;NAOYA OKAMOTO;

    申请日2014-10-14

  • 分类号H01L23/544;H01L29/778;H01L29/66;H01L23/29;H01L21/02;H01L21/78;H01L21/3105;H01L21/768;H01L29/20;H01L27/06;H01L23/31;

  • 国家 US

  • 入库时间 2022-08-21 13:44:23

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