首页> 外国专利> Temporary adhesive material for wafer, film for temporary adhesion using same, wafer processing laminate, and method for producing thin wafer using same

Temporary adhesive material for wafer, film for temporary adhesion using same, wafer processing laminate, and method for producing thin wafer using same

机译:晶圆临时粘合材料,使用该临时粘合材料的膜,晶圆加工层压板以及使用其制造薄晶圆的方法

摘要

A temporary adhesive material for a wafer includes a first temporary adhesive layer of a silicone-containing polymer layer containing a photo base generator and a second temporary adhesive layer of a silicone-containing polymer layer which is laminated on the first temporary adhesive layer, does not contain the photo base generator, and is different from the polymer layer. Thereby, there can be formed a temporary adhesive layer having high thickness uniformity, even on a wafer having a step. Because of the thickness uniformity, a thin wafer having a uniform thickness of 50 μm or less can be easily obtained. When a thin wafer is produced and then delaminated from a support, the wafer can be delaminated from the support by exposure at a low exposure dose without stress. Therefore, a brittle thin wafer can be easily handled without causing damage, and a thin wafer can be easily produced.
机译:用于晶片的临时粘合剂材料包括:包含光敏基体的含硅酮聚合物层的第一临时粘合剂层;和层压在第一临时粘合剂层上的不包含硅酮的聚合物层的第二临时粘合剂层。包含光碱产生剂,与聚合物层不同。因此,即使在具有台阶的晶片上,也可以形成具有高厚度均匀性的临时粘合层。由于厚度均匀性,可以容易地获得具有50μm或更小的均匀厚度的薄晶片。当生产薄晶片然后从支撑件上分层时,可以通过以低暴露剂量无应力地暴露将晶片从支撑件上分层。因此,可以容易地处理易碎的薄晶片而不引起损坏,并且可以容易地制造薄晶片。

著录项

  • 公开/公告号US9550931B2

    专利类型

  • 公开/公告日2017-01-24

    原文格式PDF

  • 申请/专利权人 SHIN-ETSU CHEMICAL CO. LTD.;

    申请/专利号US201414270843

  • 发明设计人 HIROYUKI YASUDA;MICHIHIRO SUGO;

    申请日2014-05-06

  • 分类号H01L21/683;C09J183/14;C08K5;C08K5/205;C08G77/52;C08G77/14;

  • 国家 US

  • 入库时间 2022-08-21 13:42:59

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