首页> 外国专利> Circuit arrangement and method with modified error syndrome for error detection of permanent errors in memories

Circuit arrangement and method with modified error syndrome for error detection of permanent errors in memories

机译:具有修正的错误校正子的电路装置和方法,用于对存储器中的永久错误进行错误检测

摘要

A circuit arrangement for detecting memory errors is provided. The circuit arrangement comprises a memory (11) and an error detection circuit (12). The circuit arrangement is designed to store a code word of an error detection code (C) or a code word that is inverted in a subset (M) of bits in the memory (11) at a memory location and to read out a data word from the memory (11) from the memory location. The error detection circuit (12) is designed, for the case where a control signal present assumes a first value, to indicate a memory error if the data word is not a code word of the error detection code (C). Furthermore, the error detection circuit (12) is designed, for the case where the control signal present assumes a second value, which is different from the first value, and the code word that is inverted in the subset (M) of bits was written to the memory location, to determine on the basis of the data word read out from the memory (11) whether a memory error is present if the code word that is inverted in the subset (M) of bits is not a code word of the error detection code (C).
机译:提供了一种用于检测存储器错误的电路装置。该电路装置包括存储器( 11 )和错误检测电路( 12 )。该电路装置被设计为在存储位置将错误检测代码(C)的代码字或在比特的子集(M)中反转的代码字存储在存储器( 11 )中并从内存位置读取内存中的数据字( 11 )。对于存在的控制信号采用第一值的情况,错误检测电路( 12 )被设计为在数据字不是错误检测代码的代码字( C)。此外,针对存在的控制信号采用不同于第一值的第二值以及在子集中反转的代码字的情况,设计了错误检测电路( 12 )将(M)位写入存储位置,以根据从存储器( 11 )读出的数据字确定如果反转的代码字是否存在存储错误。位的子集(M)不是错误检测代码(C)的代码字。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号