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SRAM storage unit based on DICE structure

机译:基于DICE结构的SRAM存储单元

摘要

The present invention provides an improved SRAM memory cell based on a DICE structure, which comprises following structures: four inverter structures formed through arranging PMOS transistors and NMOS transistors in series, wherein the part between the drains of a PMOS transistor and an NMOS transistor serves as a storage node; each storage node controls the gate voltage of an NMOS transistor of the other inverter structure and of a PMOS transistor of another inverter structure; a transmission structure consisting of four NMOS transistors, whose source, gate and drain are respectively connected with a bit line/bit bar line, a word line and a storage node. The use of an improved SRAM memory cell based on a DICE structure not only avoids such defects as small static noise margin and being prone to transmission error facing the traditional cell structures consisting of 6 transistors, but also resolves the problem that the current SRAM storage cells based on a DICE structure can easily be affected by the electrical level of storage nodes. This effectively improves reliability of storage cells.
机译:本发明提供一种基于DICE结构的改进的SRAM存储单元,其包括以下结构:通过串联布置PMOS晶体管和NMOS晶体管而形成的四个反相器结构,其中,PMOS晶体管的漏极和NMOS晶体管之间的部分用作存储节点;每个存储节点控制另一反相器结构的NMOS晶体管和另一反相器结构的PMOS晶体管的栅极电压。一种传输结构,由四个NMOS晶体管组成,其源极,栅极和漏极分别与位线/位条线,字线和存储节点连接。采用基于DICE结构的改进型SRAM存储单元,不仅避免了静态噪声容限小,面对由6个晶体管组成的传统单元结构容易产生传输错误的缺陷,而且解决了当前SRAM存储单元的问题。基于DICE结构的存储节点很容易受到电气级别的影响。这有效地提高了存储单元的可靠性。

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