首页> 外国专利> GRADED IN-SITU CHARGE TRAPPING LAYERS TO ENABLE ELECTROSTATIC CHUCKING AND EXCELLENT PARTICLE PERFORMANCE FOR BORON-DOPED CARBON FILMS

GRADED IN-SITU CHARGE TRAPPING LAYERS TO ENABLE ELECTROSTATIC CHUCKING AND EXCELLENT PARTICLE PERFORMANCE FOR BORON-DOPED CARBON FILMS

机译:梯度的原位电荷陷阱层可实现掺硼碳膜的静电卡盘和出色的颗粒性能

摘要

The present disclosure generally relates to processing chamber seasoning layers having a graded composition. In one example, the seasoning layer is a boron-carbon-nitride (BCN) film. The BCN film may have a greater composition of boron at the base of the film. As the BCN film is deposited, the boron concentration may approach zero, while the relative carbon and nitrogen concentration increases. The BCN film may be deposited by initially co-flowing a boron precursor, a carbon precursor, and a nitrogen precursor. After a first period of time, the flow rate of the boron precursor may be reduced. As the flow rate of boron precursor is reduced, RF power may be applied to generate a plasma during deposition of the seasoning layer.
机译:本公开总体上涉及具有分级组成的处理室调味层。在一个示例中,调味层是氮化硼碳(BCN)膜。 BCN膜在膜的底部可以具有更大的硼组成。随着沉积BCN膜,硼浓度可能接近零,而相对碳和氮浓度却增加。可以通过首先使硼前体,碳前体和氮前体共流来沉积BCN膜。在第一时间段之后,可以降低硼前体的流速。随着硼前驱物的流速降低,可以在调味料层的沉积过程中施加RF功率以产生等离子体。

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