首页>
外国专利>
TECHNOLOGIES FOR INVERTING LITHOGRAPHIC PATTERNS AND SEMICONDUCTOR DEVICES INCLUDING HIGH ASPECT RATIO STRUCTURES
TECHNOLOGIES FOR INVERTING LITHOGRAPHIC PATTERNS AND SEMICONDUCTOR DEVICES INCLUDING HIGH ASPECT RATIO STRUCTURES
展开▼
机译:用于转换光刻图形和半导体器件(包括高纵横比结构)的技术
展开▼
页面导航
摘要
著录项
相似文献
摘要
Technologies for inverting lithographic patterns are described. In some embodiments the technologies include a method for inverting a lithographic pattern of hole precursors, so as to form one or more high aspect ratio structures on or in a surface of a substrate.
展开▼