APPARATUS AND METHOD FOR DISCRIMINATING PHYSICAL SEMICONDUCTOR CHIP DUPLICATION BASED ON DELAY TIME

摘要

An apparatus for discriminating physical semiconductor chip duplication based on a delay time is provided. The apparatus for discriminating physical semiconductor chip duplication based on a delay time according to an embodiment of the present invention includes a power applying part for outputting an input voltage corresponding to the near threshold voltage of a MOSFET having a predetermined clock; a delay part for receiving the output of the power applying part and arranging a plurality of delay lines of a logic gate, and outputting a plurality of delay output voltages in parallel; a multiplexer for selecting two of the delay output voltages and outputting a selected output voltage; and a comparator for comparing the two selected output voltages of the multiplexer. So, a delay time feature can be more accurately determined.;COPYRIGHT KIPO 2017