METHOD FOR ANALYZING MELTING CURVE BY USING PNA PROBE FOR DIAGNOSING MICROSATELLITE INSTABILITY (MSI), METHOD FOR DIAGNOSING MSI BY USING SAME, AND KIT FOR DIAGNOSING MSI

摘要

The present invention relates to a method for analyzing a melting curve by using a PNA probe for diagnosing microsatellite instability (MSI), a method for diagnosing MSI by using the same, and a kit for diagnosing MSI. More specifically, the present invention relates to a method for analyzing a melting curve according to the structure of a fluorescent PNA probe specifically bound according to the number of lost base mutations by using the fluorescent PNA probe capable of being specifically bound with a part in which identical bases are repeated; and a method for rapidly and accurately discriminating MSI by detecting the genetic mutation of a microsatellite marker generated by a loss of a base in a part in which identical bases are repeated and by analyzing the number of base mutations through the method for analyzing a melting curve. The present invention relates to a method and a kit for diagnosing MSI by analyzing the number of lost base mutations by analyzing a melting curve by using a PNA probe bound with a reporter and a quencher. The genetic mutation of a microsatellite marker generated by a loss of a base in a part in which identical bases are repeated is detected by using five microsatellite markers of quasi loci having high sensitivity and specificity on the basis of a statistical database, and the number of base mutations caused thereby can be analyzed. Accordingly, compared to a conventional MSI diagnosing method, the method of the present invention can reduce medical consultation expenses. Also, inspection time is short, so results can be rapidly confirmed.;COPYRIGHT KIPO 2017