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SPECTROSCOPIC MICROSCOPE, AND SPECTROSCOPIC OBSERVATION METHOD

机译:光谱显微镜及光谱观察方法

摘要

PROBLEM TO BE SOLVED: To provide a spectroscopic microscope and spectroscopic observation method that can efficiently measure a spectrum.SOLUTION: A spectroscopic microscope 100 according to the present embodiment aspect comprises: a light source 11 that generates laser light L1 to be incident upon a sample 37; an edge filter 31 that branches signal light L3 generating in an illumination area 39 illuminated with laser light L2 so as to illuminate a plurality of line-like illumination areas 39 on the sample 37 from light of the same wavelength as that of the laser light L1 of the light source; a multi-slit part 51 that has a plurality of slits through which signal light L4 branched by the edge filter passes, and has the plurality of slits lined in a slit width direction; and spectrometer 60 that disperses the signal light L4 passing through the plurality of slits 53 in a dispersing direction orthogonal to a slit length direction to detect the signal light L4 by a two-dimensional array optical detector 62.SELECTED DRAWING: Figure 2
机译:解决的问题:提供一种可以有效地测量光谱的光谱显微镜和光谱观察方法。解决方案:根据本实施方式的光谱显微镜100包括:光源11,该光源11产生入射到样品上的激光L1。 37;边缘滤光器31将产生在由激光L2照射的照射区域39中产生的信号光L3分支,以从与激光L1相同波长的光照射样品37上的多个线状照射区域39。光源;多狭缝部51,具有由狭缝滤光器分支的信号光L4通过的多个狭缝,并且在狭缝宽度方向上排列有多个。光谱仪60将通过多个狭缝53的信号光L4沿与狭缝长度方向正交的色散方向进行色散,并由二维阵列光学检测器62检测出信号光L4。图2

著录项

  • 公开/公告号JP2018128325A

    专利类型

  • 公开/公告日2018-08-16

    原文格式PDF

  • 申请/专利权人 NANO PHOTON KK;

    申请/专利号JP20170020786

  • 发明设计人 FUJITA KATSUMASA;

    申请日2017-02-07

  • 分类号G01J3/04;G01N21/27;G01J3/36;G01N21/65;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:53

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