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SPECTROSCOPIC MICROSCOPE, AND SPECTROSCOPIC OBSERVATION METHOD

机译:光谱显微镜及光谱观察方法

摘要

A spectroscopic microscope (100) according to a mode of embodiment of the present invention is provided with: a light source (11) which generates laser light (L1) that is incident on a sample (37); an edge filter (31) which, in order to illuminate a plurality of line-shaped illumination regions (39) on the sample (37), causes signal light (L3) generated in the illumination region (39) illuminated by the laser light (L2) to branch from light having the same wavelength as the laser light (L1) from the light source; a multi-slit unit (51) which has a plurality of slits through which signal light (L4) caused to branch by the edge filter passes, and in which the plurality of slits are aligned in a slit width direction; and a spectroscope (60) which causes the signal light (L4) that has passed through the plurality of slits (53) to disperse in a dispersion direction orthogonal to a slit length direction, and which detects the dispersed signal light (L4) using a two-dimensional array light detector (62).
机译:根据本发明实施方式的分光显微镜(100)具备:光源(11),其产生入射到样本(37)上的激光(L1);以及光源(11)。边缘滤光器(31),其为了照射样品(37)上的多个线状照明区域(39),使在照明区域(39)中产生的信号光(L3)被激光( L2)从具有与来自光源的激光(L1)相同波长的光分支;多狭缝单元(51),其具有多个狭缝,通过边缘滤波器而分支的信号光(L4)通过多个狭缝,并且多个狭缝在狭缝宽度方向上排列。分光镜(60),其使通过多个狭缝(53)的信号光(L4)在与狭缝长度方向正交的色散方向上发散,并利用分光镜检测该发散的信号光(L4)。二维阵列光检测器(62)。

著录项

  • 公开/公告号WO2018147165A1

    专利类型

  • 公开/公告日2018-08-16

    原文格式PDF

  • 申请/专利权人 NANOPHOTON CORPORATION;

    申请/专利号WO2018JP03456

  • 发明设计人 FUJITA KATSUMASA;

    申请日2018-02-01

  • 分类号G01J3/04;G01J3/36;G01N21/27;G01N21/65;G02B21/36;

  • 国家 WO

  • 入库时间 2022-08-21 12:43:04

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