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SEMICONDUCTOR DEVICE, SYSTEM-IN-PACKAGE, AND ON-VEHICLE SYSTEM-IN-PACKAGE

机译:半导体器件,系统级封装和车载系统级封装

摘要

PROBLEM TO BE SOLVED: To suppress breaking of solder balls in a case where a high-temperature environment and a low-temperature environment are repeated.SOLUTION: A semiconductor device 10 has a semiconductor integrated circuit 20 and a substrate 11. The semiconductor integrated circuit 20 is a semiconductor chip, for example. The semiconductor integrated circuit 20 and the substrate 11 are different in thermal expansion coefficient. The substrate 11 has a plurality of solder balls 12 on an opposite surface to a surface for mounting the semiconductor integrated circuit 20. The substrate 11 has no solder ball 12 at a position corresponding to at least one side of a circumference of the semiconductor integrated circuit 20.SELECTED DRAWING: Figure 2
机译:解决的问题:在重复高温环境和低温环境的情况下,为了抑制焊球的破裂。解决方案:半导体器件10具有半导体集成电路20和基板11。半导体集成电路20是例如半导体芯片。半导体集成电路20和基板11的热膨胀系数不同。基板11在与用于安装半导体集成电路20的表面相对的表面上具有多个焊球12。基板11在与半导体集成电路的圆周的至少一侧相对应的位置处没有焊球12。 20.SELECTED DRAWING:图2

著录项

  • 公开/公告号JP2018056228A

    专利类型

  • 公开/公告日2018-04-05

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORP;

    申请/专利号JP20160188185

  • 发明设计人 BETSUI TAKAFUMI;

    申请日2016-09-27

  • 分类号H01L23/12;H01L21/60;H01L25/04;H01L25/18;

  • 国家 JP

  • 入库时间 2022-08-21 13:10:59

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