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Flip-Chip-Assembled -Band CMOS Chip Modules on Ceramic Integrated Passive Device With Transition Compensation for Millimeter-Wave System-in-Package Integration

机译:具有过渡补偿的陶瓷集成无源器件上的倒装芯片组装的带CMOS芯片模块,用于毫米波封装系统集成

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In this paper, $W$-band flip-chip-assembled CMOS chip modules with transition compensation are presented, a three-stage amplifier, a balanced amplifier, and a down-converted Gilbert-cell subharmonic mixer are included in the chip set. The flip-chip process on ceramic integrated passive devices (CIPD) with a bump size of 30 $mu$m $,times,$30 $mu$m $,times,$27 $mu$m is developed for millimeter-wave applications. Without the flip-chip transition compensation, the frequency of the return loss of each chip is shifted, which deviates from the bare die measurement results. By applying the compensation network in the transition, the dips of the return loss are tuned back closer to the bare die measurement results. Moreover, a $W$ -band amplifier flip-chip-assembled with a CPW-fed Yagi–Uda antenna on a CIPD and a $W$ -band flip-chip-assembled receiver are presented for SiP integration. The effect of dicing edge variation is also included in the flip-chip model to achieve reasonable agreement between simulated and measured scattering parameters. To the best of our knowledge, this is the first demonstration of a CMOS chip set with flip-chip interconnects in the $W$-band for a system-in-package.
机译:本文介绍了具有过渡补偿的$ W $带倒装芯片组装CMOS芯片模块,该芯片组中包括一个三级放大器,一个平衡放大器和一个下变频吉尔伯特单元次谐波混频器。陶瓷集成无源器件(CIPD)的倒装芯片工艺是针对毫米波应用而开发的,其凸点尺寸为30μm$ m $倍$30μm$ m $倍$27μm。如果没有倒装芯片过渡补偿,则每个芯片的回波损耗频率都会偏移,这与裸芯片测量结果有所不同。通过在过渡中应用补偿网络,可以将回波损耗的谷值调整得更接近裸芯片测量结果。此外,还介绍了将带CPW馈送的Yagi–Uda天线倒装芯片组装的$ W $带放大器和用于SiP集成的$ W $带倒装芯片组装的接收器。切块边缘变化的影响也包括在倒装芯片模型中,以在模拟和测量的散射参数之间实现合理的一致性。据我们所知,这是第一个演示CMOS芯片组的系统级封装,该芯片组具有$ W $波段的倒装芯片互连。

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