TRANSIENT PHENOMENON ANALYSIS DEVICE, METHOD, AND PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a transient phenomenon analysis device, method and program capable of securing sufficient accuracy and dramatically shortening the time required for analyzing a transient phenomenon.SOLUTION: A transient phenomenon analysis device 1 comprises a dynamic phasor analysis unit 14a for performing an analysis with dynamic phasor by a prescribed first time in a first period in which distortion of waveforms of voltage and current hardly occurs and an instantaneous value analysis unit 14b for performing an instantaneous value analysis by a second time with a smaller interval than by the first time in a second period in which waveforms of voltage and current distort largely.SELECTED DRAWING: Figure 1