首页> 外国专利> TRANSISTOR USING SELECTIVE UNDERCUT AT GATE CONDUCTOR AND GATE INSULATOR CORNER

TRANSISTOR USING SELECTIVE UNDERCUT AT GATE CONDUCTOR AND GATE INSULATOR CORNER

机译:在选通导体和选通绝缘体角处采用选择性欠压的晶体管

摘要

Methods form transistor structures that include, among other components, a substrate having an active region bordered by an isolation region, a gate insulator on the substrate, and a gate conductor on the gate insulator. First and second sections of the gate conductor are within the active region of the substrate, while a third section is in the isolation region of the substrate. The second section of the gate conductor tapers from the width of the first section to the width of the wider third section. The first section and the second section of the gate conductor have undercut regions where the corner of the gate conductor contacts the substrate. The third section of the gate conductor lacks the undercut regions. The gate insulator is relatively thicker in the undercut regions and is relatively thinner where the corner of the gate conductor lacks the undercut regions in the isolation region.
机译:该方法形成晶体管结构,该晶体管结构包括:除其他组件之外的衬底,该衬底具有以隔离区域为边界的有源区域,该衬底上的栅极绝缘体以及该栅极绝缘体上的栅极导体。栅极导体的第一和第二部分在衬底的有源区内,而第三部分在衬底的隔离区内。栅极导体的第二部分从第一部分的宽度到较宽的第三部分的宽度逐渐变细。栅极导体的第一部分和第二部分具有底切区域,在该底切区域中,栅极导体的角接触衬底。栅极导体的第三部分没有底切区域。栅极绝缘体在底切区域中相对较厚,并且在栅极导体的拐角在隔离区域中缺少底切区域的情况下相对较薄。

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