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Efficient Ceff model for gate output slew computation in early synthesis

机译:高效的 C eff 模型,用于早期合成中的门输出压摆计算

摘要

A slew-based effective capacitance (Ceff) is used to compute gate output slew during early synthesis of an integrated circuit design. A π model is constructed for the gate and reduced to two parameters which are used to compute a slew value for the model, given a slew definition. A capacitance coefficient is then calculated as a function of this slew value. The effective capacitance is the product of the coefficient and the total capacitance of the π model. The output slew of the gate may in turn be computed using the slew-based Ceff. The coefficient may be computed by iteratively solving an equation representing output voltage over time dependent on the first and second parameters, by directly solving a closed-form equation which is a function of the first and second parameters, or by looking up the capacitance coefficient in a table indexed by the first and second parameters.
机译:基于压摆的有效电容(C eff )用于在集成电路设计的早期综合过程中计算栅极输出压摆。为门构建一个π模型,并在给定压摆定义的情况下,将其简化为两个参数,用于计算该模型的压摆值。然后根据该压摆值计算电容系数。有效电容是系数与π模型总电容的乘积。门的输出压摆可以依次使用基于压摆的C eff 来计算。可以通过迭代求解取决于第一和第二参数的表示随时间变化的输出电压的方程,通过直接求解作为第一和第二参数的函数的闭式方程,或通过查找电容系数来计算系数。由第一和第二参数索引的表。

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