首页> 外国专利> Nonvolatile semiconductor memory device having a control circuit that controls voltage applied to non-selected word lines connected to unselected memory cells

Nonvolatile semiconductor memory device having a control circuit that controls voltage applied to non-selected word lines connected to unselected memory cells

机译:具有控制电路的非易失性半导体存储器件,该控制电路控制施加到连接到未选择的存储单元的未选择的字线的电压

摘要

A nonvolatile semiconductor memory device according to one embodiment of the present invention includes: a memory cell array and a control circuit. The control circuit executes a first reading operation and a second reading operation. The first reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between a control gate electrode and source of the selected memory cell to a first value. The second reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between the control gate electrode and source of the selected memory cell to a second value lower than the first value. When executing the second reading operation, the control circuit keeps a voltage of the control gate electrode of the selected memory cell to 0 or a positive value.
机译:根据本发明的一个实施例的非易失性半导体存储装置包括:存储单元阵列和控制电路。控制电路执行第一读取操作和第二读取操作。第一读取操作是通过将控制栅电极和所选存储单元的源极之间的电压设置为第一值来读取在所选存储单元中设置的阈值电压的操作。第二读取操作是通过将控制栅电极和所选存储单元的源极之间的电压设置为低于第一值的第二值来读取在所选存储单元中设置的阈值电压的操作。当执行第二读取操作时,控制电路将所选存储单元的控制栅电极的电压保持为0或正值。

著录项

  • 公开/公告号US9947415B2

    专利类型

  • 公开/公告日2018-04-17

    原文格式PDF

  • 申请/专利权人 TOSHIBA MEMORY CORPORATION;

    申请/专利号US201715598554

  • 申请日2017-05-18

  • 分类号G11C16/04;G11C16/26;G11C11/56;G11C16/14;G11C16/34;G11C16/08;G11C16/10;

  • 国家 US

  • 入库时间 2022-08-21 12:59:06

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