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Lateral high voltage integrated devices having trench insulation field plates and metal field plates

机译:具有沟槽绝缘场板和金属场板的横向高压集成器件

摘要

A high voltage integrated device includes a source region and a drain region disposed in a semiconductor layer and spaced apart from each other, a drift region disposed in the semiconductor layer and surrounding the drain region, a channel region defined in the semiconductor layer and between the source region and the drift region, a trench insulation field plate disposed in the drift region, a recessed region provided in the trench isolation field plate, a metal field plate disposed over the trench insulation field plate, and filling the recessed region, a gate insulation layer provided over the channel region and extending over the drift region and over the trench insulation field plate, and a gate electrode disposed over the gate insulation layer.
机译:高压集成器件包括:源极区和漏极区,其布置在半导体层中并且彼此间隔开;漂移区,其布置在半导体层中并且围绕漏极区;沟道区,其限定在半导体层中并且在半导体层之间。源极区和漂移区,设置在漂移区中的沟槽绝缘场板,设置在沟槽隔离场板中的凹陷区,设置在沟槽绝缘场板上的金属场板并填充该凹陷区,栅极绝缘体设置在沟道区上方并在漂移区上方和沟槽绝缘场板上方延伸的层;以及设置在栅极绝缘层上方的栅电极。

著录项

  • 公开/公告号US9852993B2

    专利类型

  • 公开/公告日2017-12-26

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号US201615017308

  • 发明设计人 SUNG KUN PARK;

    申请日2016-02-05

  • 分类号H01L29/78;H01L23/535;H01L29/40;H01L29/08;H01L29/10;H01L29/06;

  • 国家 US

  • 入库时间 2022-08-21 12:56:17

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