首页> 外国专利> Patterned poly silicon structure as top electric contact to MOS-type optical modulators

Patterned poly silicon structure as top electric contact to MOS-type optical modulators

机译:图案化的多晶硅结构作为MOS型光学调制器的顶部电触点

摘要

A metal-oxide-semiconductor (MOS) type semiconductor device, comprising a silicon substrate, a first cathode electrode and a second cathode electrode coupled to the silicon substrate and located on distal ends of the silicon substrate, a poly-silicon (Poly-Si) gate proximally located above the silicon substrate and between the first cathode electrode and the second cathode electrode, wherein the Poly-Si gate comprises a first post extending orthogonally relative to the silicon substrate comprising a first doped silicon slab, a second post extending orthogonally relative to the silicon substrate comprising a second doped silicon slab, wherein the second post is positioned so as to create a width between the first post and the second post, an anode electrode coupled to the first post and the second post and extending laterally from the first post to the second post, and a dielectric layer disposed between the first silicon substrate and the second silicon substrate.
机译:一种金属氧化物半导体(MOS)型半导体器件,包括:硅衬底;耦合到所述硅衬底并位于所述硅衬底的远端上的第一阴极和第二阴极;多晶硅(Poly-Si )在硅衬底上方并在第一阴极电极和第二阴极电极之间向近侧延伸的栅极,其中,多晶硅栅包括相对于包括第一掺杂硅平板的硅衬底正交延伸的第一柱,第二柱相对于正交延伸的第二柱包括第二掺杂硅平板的硅衬底,其中定位第二柱以在第一柱和第二柱之间产生宽度,阳极电极耦合到第一柱和第二柱并从第一柱横向延伸。柱到第二柱,以及介电层,其设置在第一硅衬底和第二硅衬底之间。

著录项

  • 公开/公告号US9823499B2

    专利类型

  • 公开/公告日2017-11-21

    原文格式PDF

  • 申请/专利权人 FUTUREWEI TECHNOLOGIES INC.;

    申请/专利号US201615336489

  • 发明设计人 QIANFAN XU;XIAO SHEN;HONGMIN CHEN;

    申请日2016-10-27

  • 分类号G02F1/025;H01L29/66;H01L29/94;

  • 国家 US

  • 入库时间 2022-08-21 12:55:38

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