ACTIVITY COVERAGE ASSESSMENT OF CIRCUIT DESIGNS UNDER TEST STIMULI

摘要

Aspects of the disclosed technology relate to techniques of activity coverage assessment. Transistor-level circuit simulation is performed for a circuit design under a set of test stimuli, which determines values of one or more electrical properties for each of circuit elements of interest in the circuit design. The one or more electrical properties are selected based on information of the each of circuit elements of interest, which comprises what circuit element type the each of circuit elements of interest belongs to. Based on the values of the one or more electrical properties, activity coverage information comprising information about which circuit elements in the circuit elements of interest are active or inactive under the set of test stimuli is determined.