State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume V. Design for Testability.

摘要

Designing for testability if needed to reduce costs associated with testing and maintaining electronic systems. Two approaches are considered: (1) modification of established circuits and (2) general design of new circuits where testability is a major consideration. Computer programs TMEAS and SCOAP, developed for evaluating testability in established circuits, are discussed. In the design of new circuits only a few techniques are known that yield highly testable circuits without sacrificing other desirable traits, two, IBM's LSSD method and bit slicing, are discussed. (Author)