TRANSFER LOCATION-MEASURING TEST DUMMY USED IN SEMICONDUCTOR OR DISPLAY SYSTEM FIELD AND PRECISE TRANSFER MEASURING METHOD USING TRANSFER LOCATION-MEASURING TEST DUMMY USED IN SEMICONDUCTOR OR DISPLAY SYSTEM FIELD

摘要

A disclosed transfer location-measuring test dummy used in a semiconductor or display system field comprises a dummy body, a pinhole image measuring member, a slot image measuring member, and a central processing member. Therefore, the test dummy is advantageous in that the same can measure the height of a slot inside a storage case so as to prevent an object to be sensed from colliding against the slot, and can determine whether the object to be sensed is transferred normally to a location to which the object is to be transferred in a manufacturing device by using a lift pinhole even when a separate reference point is not formed.