首页> 外国专利> METHODS OF FORMING A SEMICONDUCTOR DEVICE STRUCTURE INCLUDING A STAIR STEP STRUCTURE AND RELATED SEMICONDUCTOR DEVICES

METHODS OF FORMING A SEMICONDUCTOR DEVICE STRUCTURE INCLUDING A STAIR STEP STRUCTURE AND RELATED SEMICONDUCTOR DEVICES

机译:形成包括阶梯结构和相关的半导体器件的半导体器件结构的方法

摘要

The present invention relates to a method of forming a semiconductor device structure, which comprises the steps of: forming a stack structure which includes layers, each independently including a sacrificial structure and an insulating structure longitudinally adjacent to the sacrificial structure, on a substrate; forming a masking structure on a portion of the stack structure; forming a photoresist on the masking structure and on additional portions of the structure which are not covered by the masking structure; and allowing the photoresist and the stack structure to undergo a series of material removal processes to form a stair step structure by selectively removing portions of the photoresist and portions of the stack structure which are not covered by at least one of the masking structure and the remaining portions of the photoresist. A semiconductor device and an additional method of forming a semiconductor device structure are also described.
机译:本发明涉及一种形成半导体器件结构的方法,该方法包括以下步骤:在衬底上形成包括多个层的堆叠结构,每个层独立地包括牺牲结构和在纵向上与牺牲结构相邻的绝缘结构。在堆叠结构的一部分上形成掩模结构;在所述掩模结构上和所述结构的未被掩模结构覆盖的其他部分上形成光刻胶;并通过选择性地去除光刻胶和堆叠结构的未被掩模结构和剩余部分中至少一个覆盖的部分,使光刻胶和堆叠结构经历一系列的材料去除工艺,以形成阶梯结构。光刻胶的部分。还描述了半导体器件和形成半导体器件结构的附加方法。

著录项

  • 公开/公告号KR20180032194A

    专利类型

  • 公开/公告日2018-03-29

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号KR20170121170

  • 发明设计人 SORENSEN TROY R.;AKHTAR MOHD KAMRAN;

    申请日2017-09-20

  • 分类号H01L27/11556;H01L21/027;H01L27/11524;H01L27/11529;

  • 国家 KR

  • 入库时间 2022-08-21 12:40:28

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