Semiconductor test device capable of managing the life of the gender and method thereof

摘要

The present invention relates to a semiconductor test device. The semiconductor test device includes a test board for testing a semiconductor device and a gender connected between the test board and the semiconductor device and allowing the test board and the semiconductor device to be compatible. The gender includes a memory for storing gender state information. The test board reads the gender state information of the memory, performs at least one of the initial, contact, and aging gender state tests, updates the gender state information of the memory based on a gender state test result. So, it is possible to test the aging of the gender before testing semiconductor devices and enhance the reliability of the semiconductor device test.