SEMICONDUCTOR DEVICE AND A TESTING METHOD THEREOF CAPABLE OF INCREASING A LIFETIME OF THE SEMICONDUCTOR DEVICE

摘要

PURPOSE: A semiconductor device and a testing method thereof are provided to suppress heat in a stress part by controlling a gate signal of a switching device based on the stress of a semiconductor chip.;CONSTITUTION: A semiconductor device includes a semiconductor chip(1) and a stress detecting device(7). The semiconductor chip includes a gate electrode(5). A control signal applied to the gate electrode is controlled based on stress detected by the stress detecting device. A first stress detecting device detects stress applied to the center of the semiconductor chip. A second stress detecting device detects stress applied to an external side of the semiconductor chip.;COPYRIGHT KIPO 2012