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METHOD FOR PRODUCING POROUS LAYER OF SILICON CARBIDE HETEROSTRUCTURE ON SILICON SUBSTRATE

机译:在硅基体上制备碳化硅异质结构多孔层的方法

摘要

FIELD: microelectronics.SUBSTANCE: invention relates to the field of microelectronic technology, namely to a method for producing a silicon carbide semiconductor heterostructure on a silicon substrate. Layer of silicon carbide is formed by using the lattice atoms of the silicon substrate and carbon atoms, carbon is transferred in a molecular shape in a hydrogen stream at a flow rate of 0.3-0.5 L / min to the reaction zone with the lattice atoms of the silicon substrate, as a result, the conversion rate of the silicon phase into the silicon carbide phase is 2-3.5 μm / hr at a temperature of 1,340-1,360°C. Hydrocarbons are formed in the area of a container with a temperature of 1,000-1,200°C by reversible reaction of carbon with hydrogen and the transfer of hydrocarbons with dopant atoms by a carrier gas of hydrogen to the reaction zone with the lattice atoms of the silicon substrate. P-n junction is formed by doping the impurity of the preceding silicon carbide layer with atoms. Silicon substrate with a meso- and nanoporous layer is used as the silicon substrate. In particular embodiments of the invention, carbon is transferred in molecular shape as carbon tetrachloride vapor in a hydrogen stream in a molar ratio of 1: 4 to 1:10 or as a compound of the carbon-14 isotope with the dopant atom in the form of an acceptor impurity of aluminum, modifying the conductivity type of the silicon carbide phase or in the form of vapors of an organic compound of the carbon-14 isotope, supplied by a stream of hydrogen into the zone of silicon substrates.EFFECT: reduction in the growth temperature of the semiconductor silicon carbide heterostructure is achieved, growth rate of said heterostructure increases, its effectiveness is increased by reducing the self-absorption effect of beta radiation, mechanical stresses of the discrepancy decrease with the use of the heterostructure for the subsequent epitaxial growth of the semiconductor material.4 cl, 5 dwg, 6 ex
机译:一种在硅衬底上制备碳化硅半导体异质结构的方法技术领域本发明涉及微电子技术领域,即一种在硅衬底上制备碳化硅半导体异质结构的方法。利用硅衬底的晶格原子和碳原子形成碳化硅层,碳以分子形状在氢流中以0.3-0.5 L / min的速率转移到具有结果,在1,340-1,360℃的温度下,硅相到碳化硅相的转化率为2-3.5μm/ hr。通过碳与氢的可逆反应以及具有氢原子的载气将碳氢化合物与掺杂剂原子转移到反应区与硅的晶格原子,在温度为1,000-1,200°C的容器区域中形成碳氢化合物。基质。通过用原子掺杂前面的碳化硅层的杂质来形成P-n结。具有中孔和纳米孔层的硅衬底被用作硅衬底。在本发明的特定实施方案中,碳以分子形式作为四氯化碳蒸气在氢气流中以1:4至1:10的摩尔比或作为碳-14同位素与掺杂原子的化合物形式转移。铝的受主杂质,改变了碳化硅相的导电类型或以碳14同位素的有机化合物的蒸气形式出现,并通过氢流将其提供给硅衬底区域。达到半导体碳化硅异质结构的生长温度,所述异质结构的生长速率增加,其有效性通过降低β射线的自吸收效应而提高,通过将异质结构用于随后的外延,差异的机械应力减小半导体材料的生长.4 cl,5 dwg,6 ex

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