首页> 外国专利> COMPOUND AND METHOD FOR PRODUCING SAME, COMPOSITION, COMPOSITION FOR FORMING OPTICAL COMPONENT, COMPOSITION FOR FORMING LITHOGRAPHY FILM, RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, RADIATION-SENSITIVE COMPOSITION, METHOD FOR PRODUCING AMORPHOUS FILM, MATERIAL FOR FORMING LITHOGRAPHIC UNDERLAYER FILM, COMPOSITION FOR FORMING LITHOGRAPHIC UNDERLAYER FILM, METHOD FOR PRODUCING LITHOGRAPHIC UNDERLAYER FILM, METHOD FOR FORMING RESIST PATTERN, METHOD FOR FORMING CIRCUIT PATTERN, AND PURIFICATION METHOD

COMPOUND AND METHOD FOR PRODUCING SAME, COMPOSITION, COMPOSITION FOR FORMING OPTICAL COMPONENT, COMPOSITION FOR FORMING LITHOGRAPHY FILM, RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, RADIATION-SENSITIVE COMPOSITION, METHOD FOR PRODUCING AMORPHOUS FILM, MATERIAL FOR FORMING LITHOGRAPHIC UNDERLAYER FILM, COMPOSITION FOR FORMING LITHOGRAPHIC UNDERLAYER FILM, METHOD FOR PRODUCING LITHOGRAPHIC UNDERLAYER FILM, METHOD FOR FORMING RESIST PATTERN, METHOD FOR FORMING CIRCUIT PATTERN, AND PURIFICATION METHOD

机译:用于制造相同成分的化合物和方法,组成,用于形成光学组件的成分,用于形成光刻胶片的成分,抗蚀剂成分,用于形成抗蚀剂图案的方法,辐射敏感组合物,用于制造非晶膜的方法,用于形成膜的材料的材料形成光刻底层膜的方法,生产光刻底层膜的方法,形成抗蚀剂图案的方法,形成电路图案的方法以及纯化方法

摘要

A compound represented by the following formula (1) and a method for producing the same, and a composition, a composition for optical component formation, a film forming composition for lithography, a resist composition, a method for forming a resist pattern, a radiation-sensitive composition, a method for producing an amorphous film, an underlayer film forming material for lithography, a composition for underlayer film formation for lithography, a method for producing an underlayer film for lithography, a resist pattern formation method, a circuit pattern formation method, and a purification method. wherein R 1 is a 2n-valent group of 1 to 60 carbon atoms or a single bond; R 2 to R 5 are each independently a linear, branched, or cyclic alkyl group of 1 to 30 carbon atoms, an aryl group of 6 to 30 carbon atoms, an alkenyl group of 2 to 30 carbon atoms, a group represented by the following formula (A), a group represented by the following formula (B), a thiol group, or a hydroxy group, wherein at least one selected from the group consisting of R 2 to R 5 is a group selected from the group consisting of a group represented by the following formula (A) and a group represented by the following formula (B); m 2 and m 3 are each independently an integer of 0 to 8; m 4 and m 5 are each independently an integer of 0 to 9, provided that m 2 , m 3 , m 4 , and m 5 are not 0 at the same time; n is an integer of 1 to 4; and p 2 to p 5 are each independently an integer of 0 to 2: wherein each R 6 is independently an alkylene group of 1 to 4 carbon atoms; and m' is an integer of 1 or larger, and wherein R 6 is as defined above; R 7 is a hydrogen atom or a methyl group; and m" is 0 or an integer of 1 or larger.
机译:下式(1)表示的化合物及其制造方法,以及组合物,光学部件形成用组合物,光刻用成膜组合物,抗蚀剂组合物,抗蚀剂图案的形成方法,放射线敏感性组合物,非晶膜的制造方法,用于光刻的下层膜形成材料,用于光刻的下层膜形成用组合物,用于光刻的下层膜的制造方法,抗蚀剂图案形成方法,电路图案形成方法,以及纯化方法。其中R 1为1至60个碳原子的2n价基团或单键; R 2〜R 5分别独立地为碳原子数1〜30的直链,支链或环状的烷基,碳原子数6〜30的芳基,碳原子数2〜30的烯基,以下所示的基团。式(A),由下式(B)表示的基团,硫醇基或羟基,其中选自由R 2至R 5组成的组中的至少一个是选自由以下组成的组中的基团:由下式(A)表示的基团和由下式(B)表示的基团; m 2和m 3各自独立地是0至8的整数; m 4和m 5分别独立地是0至9的整数,只要m 2,m 3,m 4和m 5不同时为0; n为1〜4的整数。 p 2至p 5分别独立为0至2的整数:其中每个R 6独立地为1-4个碳原子的亚烷基; m'为1或更大的整数,并且其中R 6如上所定义; R 7为氢原子或甲基。 m”为0或1以上的整数。

著录项

  • 公开/公告号EP3345889A4

    专利类型

  • 公开/公告日2019-04-17

    原文格式PDF

  • 申请/专利权人 MITSUBISHI GAS CHEMICAL COMPANY INC.;

    申请/专利号EP20160842008

  • 发明设计人 ECHIGO MASATOSHI;

    申请日2016-09-02

  • 分类号C07C43/23;C07D303/28;C07B61;H01L21;C08L63;G03F7/021;G03F7/09;

  • 国家 EP

  • 入库时间 2022-08-21 12:29:08

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