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High precision imaging colorimeter with specially designed pattern closed loop calibration assisted by a spectrometer

机译:高精度成像色度计,通过光谱仪辅助进行特殊设计的模式闭环校准

摘要

The present invention provides a wide band colorimeter that can have more accurate output. A narrow band instrument, such as a spectrometer or spectrometer, can be used to calibrate a broadband colorimeter. In one embodiment, an optical inspection system can be used that includes both a wide band colorimeter and a narrow band spectrometer. As an example, a spectro-camera, which is a hybrid system comprising both a broad band colorimeter and a narrow band spectrometer, can be used for simultaneous measurement with both the wide band colorimeter and the narrow band spectrometer. Simultaneous inspection can achieve accurate calibration of the broadband colorimeter. In addition, mathematical models can be used to characterize the wide band three channel colorimeter with a narrow band multi-channel spectrometer. [Selected figure] Figure 8
机译:本发明提供了可以具有更精确输出的宽带比色计。诸如光谱仪或光谱仪之类的窄带仪器可用于校准宽带比色计。在一个实施例中,可以使用包括宽带比色计和窄带光谱仪的光学检查系统。例如,分光照相机是包括宽带比色计和窄带光谱仪的混合系统,可以用于同时利用宽带比色计和窄带光谱仪进行测量。同时检查可以实现宽带色度计的准确校准。此外,数学模型可用于通过窄带多通道光谱仪表征宽带三通道色度计。 [选定图]图8

著录项

  • 公开/公告号JP2019070648A5

    专利类型

  • 公开/公告日2019-06-13

    原文格式PDF

  • 申请/专利权人

    申请/专利号JP2018190091

  • 发明设计人

    申请日0000-00-00

  • 分类号G01J3/02;G01J3/50;G01M11;

  • 国家 JP

  • 入库时间 2022-08-21 12:25:35

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