To provide a light emission inspection method with which it is possible to improve accuracy of inspection of light emission of a light-emitting device.SOLUTION: Provided is a method for inspecting the light emission of a light-emitting device, comprising a step of preparing the light-emitting device equipped with a light emission surface on top and side faces and equipped with an electrode on an undersurface, and a step of inspecting the light emission of the light-emitting device using an inspection machine, the inspection machine including a support base in an open hole equipped with an opening on the top face, with a probe inserted therethrough, a conveyance table arranged on a support base and provided with a first inside surface and a second inside surface facing the first inside surface and provided with a storage unit, a distance between the first inside surface and the second inside surface being larger than a width of the light-emitting device, and a pressing member spaced apart from the conveyance table and provided with a translucent part arranged upward of a light-emitting device storage unit. The method for inspecting the light emission of the light-emitting device includes the steps of: bringing the side face of the light-emitting device into contact with the first inside surface of the storage unit of the conveyance table, as well as separating the light-emitting device from the second inside surface and bringing the top face of the light-emitting device into contact with the undersurface of the translucent part; and bringing the probe into contact with the electrode of the light-emitting device and inspecting the light emission of the light-emitting device.SELECTED DRAWING: Figure 2D
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