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METHOD AND DEVICE FOR DEPOSITING SILICON FILM OR GERMANIUM FILM OR SILICON GERMANIUM FILM

机译:沉积硅膜或锗膜或硅锗膜的方法和装置

摘要

To provide a technique capable of depositing an almost completely amorphous silicon film or a germanium film or a silicon germanium film, on single crystal silicon or single crystal germanium or single crystal silicon germanium.SOLUTION: A method for depositing a silicon film or a germanium film or a silicon germanium film includes a first step of preparing a processed body having as a processed surface single crystal silicon or single crystal germanium or single crystal silicon germanium, a second step of making the processed surface of the processed body absorb halogen, and a third step of supplying material gas for depositing a silicon film or a germanium film or a silicon germanium film on the processed body, and depositing an amorphous silicon film or an amorphous germanium film or an amorphous silicon germanium film on the processed surface of the processed body.SELECTED DRAWING: Figure 1
机译:提供一种能够在单晶硅或单晶锗或单晶硅锗上沉积几乎完全非晶的硅膜或锗膜或硅锗膜的技术。解决方案:一种沉积硅膜或锗膜的方法或硅锗膜包括制备具有单晶硅或单晶锗或单晶硅锗作为加工表面的加工体的第一步骤,使加工体的加工表面吸收卤素的第二步骤和第三步骤。提供用于在处理体上沉积硅膜或锗膜或硅锗膜的原料气体,以及在处理体的处理表面上沉积非晶硅膜或非晶锗膜或非晶硅锗膜的步骤。选定的图纸:图1

著录项

  • 公开/公告号JP2019145735A

    专利类型

  • 公开/公告日2019-08-29

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LTD;

    申请/专利号JP20180030576

  • 发明设计人 TAKAGI SATOSHI;

    申请日2018-02-23

  • 分类号H01L21/205;C23C16/24;C23C16/06;C23C16/02;C30B29/08;C30B29/06;C30B1/04;H01L21/3065;

  • 国家 JP

  • 入库时间 2022-08-21 12:23:12

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