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Method for forming split gate memory cell array with low voltage logic device and high voltage logic device

机译:用低压逻辑器件和高压逻辑器件形成分裂栅存储单元阵列的方法

摘要

A method of forming a memory device on a substrate having memory, LV and HV areas, including forming pairs of spaced apart memory stacks in the memory area, forming a first conductive layer over and insulated from the substrate, forming a first insulation layer on the first conductive layer and removing it from the memory and HV areas, performing a conductive material deposition to thicken the first conductive layer in the memory and HV areas, and to form a second conductive layer on the first insulation layer in the LV area, performing an etch to thin the first conductive layer in the memory and HV areas and to remove the second conductive layer in the LV area, removing the first insulation layer from the LV area, and patterning the first conductive layer to form blocks of the first conductive layer in the memory, LV and HV areas.
机译:一种在具有存储器,LV和HV区域的衬底上形成存储器的方法,包括在存储器区域中形成成对的间隔开的存储器堆叠,在衬底上方形成第一导电层并与之绝缘,在衬底上形成第一绝缘层。第一导电层,将其从存储器和HV区域中去除,进行导电材料沉积,以使存储器和HV区域中的第一导电层增厚,并在LV区域中的第一绝缘层上形成第二导电层,蚀刻以使存储器和HV区域中的第一导电层变薄,并去除LV区域中的第二导电层,从LV区域中去除第一绝缘层,并对第一导电层进行构图以形成第一导电层的块。内存,LV和HV区域。

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