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Using computer-aided design layout in scanning system
Using computer-aided design layout in scanning system
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机译:在扫描系统中使用计算机辅助设计布局
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摘要
A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.
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