首页>
外国专利>
Semiconductor device, electronic control system and method for evaluating electronic control system
Semiconductor device, electronic control system and method for evaluating electronic control system
展开▼
机译:半导体装置,电子控制系统和评估电子控制系统的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
In order to generate a false failure in a logic circuit without adding a new circuit to the logic circuit, a semiconductor device includes a plurality of test points includes a test point flip-flop to fix a target node within the logic circuit to a predetermined logic level when the flip-flop holds a predetermined value. A scan chain is configured by sequentially coupling a plurality of test point slip-flops. A failure injection circuit injects a failure into the target node during the normal operation of the logic circuit, by generating failure data and by setting the generated failure data to the scan chain through a scan-in node of the scan chain.
展开▼