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Method for analyzing a sample with a non-linear microscopy technique and non-linear microscope associated

机译:用非线性显微镜技术分析样品的方法及相关的非线性显微镜

摘要

The present invention concerns a method for generating a pattern of light, this method comprising the following steps: a) emitting an input laser pulse (P1), b) deflecting the input laser pulse (P1) by a first deflector (22) to obtain a first laser pulse, c) deflecting the first laser pulse (P3) by a second deflector (24) to obtain a second laser pulse (P4), and d) focusing the pulse (P4) by an optical element characterized in that: —the first deflector (22) shapes the first laser pulse (P3) according to a first function, —the second deflector (24) shapes the second laser pulse (P4) according to a second function, and—the first function f(x) and the second function g(y) are computed and/or optimized to obtain the desired pattern of light.
机译:本发明涉及一种产生光图案的方法,该方法包括以下步骤:a)发射输入激光脉冲(P 1 ),b)使输入激光脉冲(P 1 )通过第一偏转器( 22 )获得第一激光脉冲,c)用第二偏转器偏转第一激光脉冲(P 3 ) ( 24 )获得第二激光脉冲(P 4 ),并且d)通过光学元件将脉冲(P 4 )聚焦,其中:-第一偏转器( 22 )根据第一函数对第一激光脉冲(P 3 )进行整形,-第二偏转器( 24 )根据第二函数对第二激光脉冲(P 4 )进行整形,并且-计算和/或优化第一函数f(x)和第二函数g(y)以获得所需的光模式。

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