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Integrated circuits and processes for protection of standard cell performance from context effects

机译:用于保护标准单元性能免受环境影响的集成电路和工艺

摘要

Integrated circuit (5) includes substrate (10) with surface (20) and structure (30) including base levels (45.i, 45.(i+1)), terminating cells (48, 49), and block (40) of standard cells arranged in rows (42.i, 42.(i+1)), and another type of block (60) outside block (40). Standard cells at at least two edges of block (40) have the following protections: (1) block (60) has strip of separation (41.j) having at least a minimum width from the edges of block (40), and protected by one of the following: (2) terminating cells (48, 49) reduce context effect and some terminating cells (48) are placed at at least one end of rows (42.i, 42.(i+1)) of standard cells within first-named block (40), and (3) the terminating cells (48, 49) reduce context effect and some terminating cells (49) are at one end of a column of standard cells within block (40). Other structures, devices, and processes are also disclosed.
机译:集成电路( 5 )包括具有表面( 20 )的基板( 10 )和包含基底的结构( 30 ) ( 45。 i, 45 。( i +1)),终止细胞( 48 ,49 )和块( 40 )的标准单元格按行( 42。 i, 42 < /B>.(i+1)和位于块( 40 )之外的另一种块( 60 )。至少在块( 40 )的两个边缘处的标准单元具有以下保护:(1)块( 60 )具有分隔带( 41)。 40 )的边缘开始至少具有最小宽度的B> j ),并受到以下任一保护:(2)终止单元格( 48,49 )减少了上下文效应,并且某些终止单元( 48 )放置在行的至少一端( 42。 i,< /I>42.(i+1))在名字块( 40 )中的标准单元格,以及(3)终止符单元格( 48,49 )会降低上下文效应,并且某些终止单元格( 49 )位于块( 40 )中一列标准单元格的一端>)。还公开了其他结构,设备和过程。

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