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ON-CHIP TDDB DEGRADATION MONITORING AND FAILURE EARLY WARNING CIRCUIT FOR SOC
ON-CHIP TDDB DEGRADATION MONITORING AND FAILURE EARLY WARNING CIRCUIT FOR SOC
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机译:SOC的片上TDDB降级监控和故障早期预警电路
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摘要
An on-chip TDDB degradation monitoring and failure early warning circuit for SoC. A control circuit module converts Q1 and Q0 signals into a switch state control signal and outputs the switch state control signal to a digital conversion module for TDDB performance degradation. A MOS transistor of a first MOS transistor circuit within the digital conversion module for TDDB performance degradation is in a stress state of a supply voltage, and a MOS transistor of a second MOS transistor circuit is in a non-stress state. The first and second MOS transistor circuits output a first frequency value and a second frequency value to the output selection module. The output selection module outputs the first frequency value from the digital conversion module to the counter B for recording, or outputs the second frequency value to the counter A for recording. The counter module determines the degradation level of TDDB performance.
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