A crystalline Form I of the compound of the formula (I): ** Formula ** characterized by a powder X-ray diffraction pattern (XPRD) comprising approximate peak positions (grades 2 θ ± 0.2) when measured using radiation Kα of Cu, 9.3, 16.6, 18.5, 19.4, 21.5, and 25.7, when the XPRD is collected from approximately 5 to approximately 38 degrees 2 θ.
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