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METHOD FOR MEASURING THERMAL CONDUCTIVITY OF THIN FILM BASED ON FLUORESCENT MICRO-NANO-PARTICLES

机译:荧光微纳米粒子的薄膜热导率测量方法

摘要

A method for measuring thermal conductivity of a thin film based on fluorescent micro-nano-particles, comprising: providing fluorescent micro-nano-particles, heating the fluorescent micro-nano-particles, and determining a temperature coefficient by measuring the relationship between PL spectrum (photoluminescence spectra) characteristic peak displacement of the fluorescent micro-nano-particles and temperature change (S1); placing a thin film to be detected on a substrate, and placing a heat-absorbing resource and the fluorescent micro-nano-particles on the surface of the thin film to be detected (S2); irradiating the thin film to be detected with laser, and determining a relationship slope by measuring the relationship between the PL spectrum characteristic peak displacement of the fluorescent micro-nano-particles and the laser power change (S3); and measuring the thermal conductivity of the thin film by combining an optical power absorption coefficient of the heat-absorbing resource and shape characteristic parameters of the thin film to be detected (S4). The measuring method can realize nondestructive, convenient and reliable measurement of the thermal conductivity of the micro-nano-thin film.
机译:一种基于荧光微纳米粒子的薄膜导热系数的测量方法,包括:提供荧光微纳米粒子,加热所述荧光微纳米粒子,并通过测量PL光谱之间的关系确定温度系数。 (光致发光光谱)荧光微纳米粒子的特征峰位移和温度变化(S1);在基板上放置被检测薄膜,在被检测薄膜的表面放置吸热源和荧光微纳米粒子(S2)。用激光照射待检测的薄膜,并通过测量荧光微纳米粒子的PL光谱特征峰位移与激光功率变化之间的关系,确定关系斜率(S3);通过将吸热资源的光功率吸收系数与待检测薄膜的形状特征参数相结合来测量薄膜的导热率(S4)。该测量方法可以实现对微纳米薄膜热导率的无损,方便,可靠的测量。

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