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/ DUAL PLASMA VOLUME PROCESSING APPARATUS FOR NEUTRAL/ION FLUX CONTROL

机译:/用于中性/离子通量控制的双等离子体积处理装置

摘要

The semiconductor wafer processing apparatus includes a first electrode exposed to a first plasma generation volume, a second electrode exposed to a second plasma generation volume, and a gas distribution unit disposed between the first plasma generation volume and the second plasma generation volume do. The first electrode is defined to deliver radio frequency (RF) power to the first plasma generation volume and to distribute the first plasma process gas to the first plasma generation volume. The second electrode is defined to deliver RF power to the second plasma generation volume and hold the substrate in an exposed state relative to the second plasma generation volume. The gas distribution unit includes an array of through-holes defined to fluidly connect the first plasma generation volume to the second plasma generation volume. The gas distribution unit also includes an array of gas supply ports defined to distribute the second plasma process gas to the second plasma generation volume.
机译:该半导体晶片处理设备包括:第一电极,其暴露于第一等离子体产生体积;第二电极,其暴露于第二等离子体产生体积;以及气体分配单元,其布置在第一等离子体产生体积与第二等离子体产生体积之间。限定第一电极以将射频(RF)功率传送到第一等离子体产生体积,并且将第一等离子体处理气体分配到第一等离子体产生体积。限定第二电极以将RF功率传送到第二等离子体产生体积,并将衬底相对于第二等离子体产生体积保持在暴露状态。气体分配单元包括被限定为将第一等离子体产生体积流体连接到第二等离子体产生体积的通孔阵列。气体分配单元还包括气体供应端口的阵列,气体供应端口的阵列限定为将第二等离子体处理气体分配到第二等离子体产生体积。

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