首页> 外国专利> SILICON NANOWIRES FORMED BETWEEN TOP AND BOTTOM OF MICROSCALE SENSOR STRUCTURES AND MANUFACTURING METHOD THEREOF

SILICON NANOWIRES FORMED BETWEEN TOP AND BOTTOM OF MICROSCALE SENSOR STRUCTURES AND MANUFACTURING METHOD THEREOF

机译:微尺度传感器结构的顶部和底部之间形成的硅纳米线及其制造方法

摘要

Embodiments include forming a first oxide layer on a silicon substrate (S100), etching the silicon substrate to create a recessed region for separating the nanocrystal structure from the microscale sensor structure using the first oxide layer as a mask Forming a second oxide film on the silicon substrate through a thermal oxidation process (S300); etching the recessed region to a predetermined depth in a vertical direction (S400); forming a third oxide film (S500), and etching the silicon substrate (S600) so that the nanowire structure is suspended while the floating nanowire is removed. The micro-scale sensor structure is disposed between the upper and lower ends of the microscale sensor structure / RTI
机译:实施例包括在硅衬底上形成第一氧化物层(S100),蚀刻硅衬底以使用第一氧化物层作为掩模来形成用于将纳米晶体结构与微尺度传感器结构分离的凹陷区域,从而在硅上形成第二氧化物膜。通过热氧化工艺的衬底(S300);在垂直方向上将凹陷区域蚀刻到预定深度(S400);形成第三氧化物膜(S500),并且蚀刻硅衬底(S600),使得在去除浮置纳米线的同时,纳米线结构被悬挂。微型传感器结构设置在微型传感器结构的上端和下端之间

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